Applied Materials is looking to solve the problem of producing virtually every new chip and advanced display in the world by designing, building and servicing cutting-edge equipment that helps customers manufacture display and semiconductor chips.
Requirements
- Has developed proficiency in a range of analytical processes or procedures to carry out assigned tasks
- Understand basic scanning electron microscopy (SEM)/Focused Ion Beam (FIB)/Transmission electron microscopy (TEM) principle.
- Perform SEM/FIB/TEM system, perform routine maintenance procedures, flash, plasma clean, image calibrations etc.
- Operate metrology equipment and verify and upload data to network
- Monitor data and track performance of metrology equipment and production activities per equipment requirement
- Create and update procedures and documentation
- Perform basic operations of Microsoft Outlook and Office software.
Responsibilities
- Prepares samples for experiments include cleaning samples, mount / un-mount samples, loading FOUPs, prepare jobs for experimentation, to help evaluates performance of process system
- Prepare cross section samples for scanning electron microscope (SEM) analysis and help / guide requestor to optimize sample prep procedure and conditions, identify cutting location based on pattern instructions.
- Prepare transmission electron microscope (TEM) lamella samples by focused ion beam (FIB) and help to optimize sample prep procedure and conditions, identify cutting location based on pattern instructions.
- Transfer TEM lamella from FIB, and image TEM samples
- Operate metrology tools in FIB & TEM lab to help understand cross section or top view critical dimension (CD), energy dispersive spectroscopy (EDS) analysis, take high-quality imaging pending on job assignment, identify all of patterns of interest, understand image quality requirement and sample/beam interaction to determine optimized condition, finish requested jobs under limited supervision after training.
- Understand basic scanning electron microscopy (SEM)/Focused Ion Beam (FIB)/Transmission electron microscopy (TEM) principle.
- Perform SEM/FIB/TEM system, perform routine maintenance procedures, flash, plasma clean, image calibrations etc.
Other
- 2 - 4 Years Work Experience
- Technical Diploma Skills Certifications
- Ability to lift up to 30 lbs.
- Follow safety protocol and process
- Work shift may include compressed work week schedule to meet the production
- May provide informal guidance and support to junior team members, lead/own a lab project etc
