Our client, a company creating world-changing technology, has big ambitions and a growing sense of urgency to address challenges no one can tackle alone. Their mission is to drive innovation that makes the world safer, build healthy and vibrant communities, and increases productivity.
Requirements
- Using OLAF to identify jobs ready for Critical Dimension (CD) measurements
- Using JPM software for data exporting
- Analyzing data, measurements and their patterns
- Knowledge and experience working with Semiconductors
- Hands-on analytical tool experience including SEM, Transmission Electron Microscopy and/or beam based tools.
- Basic knowledge of Semiconductors
- Metrology data processing and statistical analysis
Responsibilities
- Identify jobs ready for Critical Dimension (CD) measurements or review using OLAF task management software and/or shared databases.
- Retrieve and load images based on job ID from the GT website.
- Review and validate automated CD measurements, correcting errors or performing manual measurements as needed, following provided SPECs and Best Known Methods (BKMs).
- Export measurement data into JMP for trend analysis and comparison.
- Analyze data to identify outliers, false positives, and false negatives, applying appropriate filtering based on job context.
- Compile and generate reports summarizing measurement results and findings.
- Apply foundational knowledge of semiconductor processes, critical dimensions, and metrology; prior experience in semiconductor analysis is a plus.
Other
- Bachelor of Science in the STEM field or 4 years of experience working in a similar environment
- Has an understanding of device physics and circuits
- Applicants must be authorized to work for ANY employer in the US. We are unable to sponsor or take over sponsorship of employment Visas.
